Showing results: 91 - 105 of 166 items found.
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Extech PQ3210 -
Extech Instruments Corporation
The Extech PQ3210 is a set of three flexible 1200 Amp flex clamps for the Extech PQ3350 3-Phase Power and Harmonics Analyzer. These probes are 304 mm (12 in) long for wrapping around busbars.
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Guided Wave
The optical or spectrum analyzer is the brain which transforms the signal collected by the sample interface into actionable information. Guided Wave sample interfaces (probes, flow cells) are designed for use with NIR or UV-Vis fiber optic coupled analyzers. They are designed to be rugged and reliable in harsh chemical and physical process conditions while providing optimal light transmission for long-term reliable measurements. More information is available about specific analyzers on each product page or on the process analyzer product overview.
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SV Probe, Inc.
SV TCL also has the capability to emulate the testing environment with our probe card analyzers including newly installed direct dock analyzers in the United States, Taiwan and Vietnam. SV TCL is dedicated to continuous product improvement so that we can provide our customers the latest and most innovative test solutions.
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PGY-UHS II SD/SDIO -
Prodigy Technovations Pvt. Ltd.
UHS II Protocol Analyzer (PGY-UHS II SD/SDIO) is the Protocol Analyzer with multiple features to capture and debug communication between host and design under test. PGY-UHS II SD/SDIO UHS II Protocol Analyzer is the most feature rich comprehensive Protocol Analyzer available to capture and debug UHS-II protocol data. PGY-UHS-II Protocol Analyzer supports FD156 and HD312 data rate. The innovative active probe has minimum electrical loading on device under test (DUT) and captures protocol data without affecting the performance of DUT.
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GE Oil & Gas Digital Solutions
Scalable to your needs, GE offers reliable moisture and humidity measurement solutions from multi-feature sensors, moisture analyzers and highly sensitive, stable oxide moisture probes to precise moisture generators.
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W3301A -
Keysight Technologies
The W3301A LPDDR3 rigid BGA interposer for LPDDR3 178-ball DRAM enables capture of simultaneous read and write traffic at data rates in excess of 1866 Mb/s. E5406A Soft Touch probes and U4201A cables connect the W3301A LPDDR3 BGA interposer into the U4164A logic analyzer module. The W3301A LPDDR3 178-ball rigid BGA interposer allows signal access to the LPDDR3 signals critical to your debug and validation effort through a U4164A logic analyzer. The probe works in existing designs and eliminates the need for up-front planning or redesign. The probe connects directly to the balls of the DRAM using a LPDDR3 178-ball riser (included) or an optional 3rd party socket (not provided), enabling operation and acquisition of LPDDR3 signals.
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LF1 set -
Langer EMV-Technik GmbH
The LF1 near-field probe set consists of 4 shielded near-field probes used during the development process for emission measurement of longwave, medium wave, and shortwave frequencies on electronic devices. The probe heads of the LF1 set are designed for incremental detection of sources of electromagnetic interference on assemblies. First, the electromagnetic interference of the assembly is detected by the LF-R 400 probe from up to 10 cm. Then probes with higher resolution like the LF-B 3, LF-U 5 and LF-U 2.5 are used to more precisely detect any source of interference. The probe heads are designed for taking measurements at single pins and larger components. Near-field probes are small and handy. They have a current attenuating sheath and, therefore, are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probes do not have an internal terminating resistance of 50 Ω.
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41800A -
Keysight Technologies
The Keysight 41800A Active Probe provides high input impedance from 5 Hz to 500 MHz. The Keysight 41800A is a valuable tool when used with a network and spectrum analyzer for circuit signal analysis.
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85024A -
Keysight Technologies
85024A high-frequency probe makes it easy to perform in-circuit measurements. An input capacitance of only 0.7 pF shunted by 1 megohm of resistance permits high frequency probing without adversely loading the circuit under test. Excellent frequency response and unity gain guarantee high accuracy in swept measurements with this probe. High probe sensitivity and low distortion levels allow measurements to be made while taking advantage of the full dynamic range of RF analyzers.
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Guided Wave
The sample interface is a virtual “windows into the process” and is a critical component of any optical analyzer system. Guided Wave sample interfaces (probes, flow cells) are designed for use with NIR or UV/Vis fiber optic coupled analyzers. They are designed to be rugged and reliable in harsh chemical and physical process conditions while providing optimal transmission for long-term reliable measurements.
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XF1 set -
Langer EMV-Technik GmbH
The XF1 set of near field probes consists of 4 passive near field probes and one passive E field probe for making measurements in the development phase of the magnetic and electric fields in ranges from 30 MHz to 6 GHz. Due to their integrated impendance matching, the probes are less sensitive in the lower frequency range than the RF type probes. The probe heads of the XF1 set allow for the step by step identification of interference sources of the magnetic field on an electronic assembly. At first, for example the XF-R 400-1 detects the fields which the assembly emits in total. Next, using higher resolution probes the interference sources can be more precisely detected. The E field probe is used for the detection of electric interfering fields near the assemblies. With trained use of the near field probes, field orientation and field distribution can be detected. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.
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Intellitech Corp.
The Eclipse Test Development Environment automatically creates tests that are used to bring up new products in the lab. Failures can be quickly debugged using software tools such as the Eclipse Timing Diagram Analyzer and the Schematic Logic Probe.
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RF2 set -
Langer EMV-Technik GmbH
The RF2 near field probe set consists of 4 passive near field probes for measurements in the development phase of the magnetic field in the range from 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF2 set allow the step by step localization of interference sources of the RF magnetic field on assemblies. From greater distances the electromagnetic interference can be detected by RF-R 400-1 and RF-R 50-1 probes. The RF-B 3-2 and RF-U 5-2 probes with their higher resolution can more precisely detect the interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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CA10 -
Teledyne LeCroy
The CA10 is a programmable and customizable interface device that seamlessly incorporates third party current transducers/transformers with Teledyne LeCroy oscilloscopes or motor drive analyzers. It allows the third party device to be recognized and operate as if it were a Teledyne LeCroy probe.
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RF1 set -
Langer EMV-Technik GmbH
The RF1 near field probe set consists of 4 passive near field probes for making measurements in the development phase of E-field and magnetic field in the ranges of 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF1 set allow for measurements close to the electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors in order to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
